WE-A7.1P.9
Analysis of Efficient Test Indicators of Phased Array Based on Radio Frequency Fingerprint
Haining Yang, University of Electronic Science and Technology of China; Tianfu Wireless Intelligence Research Institute, China; Yining Xiong, University of Electronic Science and Technology of China, China; Duo Wang, China Star Network Application Co., Ltd., China; Haiyan Huang, Chongqing Liangjiang Satellite Mobile Communication Co., Ltd., China; Ruijie Chen, Na Li, University of Electronic Science and Technology of China, China
Session:
Antenna Measurement: Material, RCS and Phased Array Measurements Oral
Track:
AP-S: Track 7: Antenna Measurements
Location:
Room 251C
Session Time:
Wed, 15 Jul, 13:20 - 17:00
Presentation Time:
Wed, 15 Jul, 16:20 - 16:40
Presentation
Discussion
Session WE-A7.1P
WE-A7.1P.1: Permittivity Spectrum Extraction of Liquids via Input Impedance Perturbations of a Monopole Patch Antenna Sensor
Wendi Zhu, Masoud Baghelani, Peter Light, Ashwin Iyer, University of Alberta, Canada
WE-A7.1P.2: High-Frequency Characterization of Thin Film Materials using Contactless Pin-Flanges Waveguide System
Alexander Bartenev, Rafael Rodríguez Solís, Larry Theran, Armando Rúa, University of Puerto Rico at Mayagüez, United States
WE-A7.1P.3: Electromagnetic Modeling of High-k Gate Dielectrics in High-power RF Transistor for Performance Optimization
Fan Cheng, Kubilay Sertel, The Ohio State University, United States
WE-A7.1P.4: A Tunable 3D-Printed Waveguide Method with ABCD Matrix De-Embedding for Accurate Microwave Permittivity Measurement of Liquids
Julianne Oshiro, Shih-Ming Huang, Yan Jean Wei, Ah-Hyung Alissa Park, Yuanxun Ethan Wang, University of California, Los Angeles, United States
WE-A7.1P.5: Reliable Loss Tangent Extraction of Low-Loss Materials in WR15 and WR10 Bands Using MCK Setup
Alperen Sari, University of Birmingham, United Kingdom; Liam Ausden, Xiaobang Shang, National Physical Laboratory (NPL, United Kingdom; Costas Constantinou, Miguel Navarro-Cía, University of Birmingham, United Kingdom
WE-A7.1P.6: Thickness Discrimination of Metallic Layers Using Optical Readout of Microwave-Induced Thermo-Elastic Effects in a Glass Superstrate
Hyunjae Shin, Wonbin Hong, Pohang University of Science and Technology, Korea (South)
WE-A7.1P.7: Metalens-Assisted RF Ellipsometry for Prior-Free, Simultaneous Measurement of Permittivity and Thickness in Ka-Band
Hyunjae Shin, Wonbin Hong, Pohang University of Science and Technology, Korea (South)
WE-A7.1P.8: Introducing a-Priori Information to Radar Cross Section Evaluation
Michael Kleinschmidt, Martin Petek, Francesca Vipiana, Politecnico di Torino, Italy
WE-A7.1P.9: Analysis of Efficient Test Indicators of Phased Array Based on Radio Frequency Fingerprint
Haining Yang, University of Electronic Science and Technology of China; Tianfu Wireless Intelligence Research Institute, China; Yining Xiong, University of Electronic Science and Technology of China, China; Duo Wang, China Star Network Application Co., Ltd., China; Haiyan Huang, Chongqing Liangjiang Satellite Mobile Communication Co., Ltd., China; Ruijie Chen, Na Li, University of Electronic Science and Technology of China, China
WE-A7.1P.10: Non-Ideal Array Parameter Analysis for a Radio Frequency Fingerprint-Based Phased-Array Measurement Method
Haining Yang, University of Electronic Science and Technology of China; Tianfu Wireless Intelligence Research Institute, China; Yining Xiong, University of Electronic Science and Technology of China, China; Duo Wang, China Star Network Application Co., Ltd., China; Haiyan Huang, Chongqing Liangjiang Satellite Mobile Communication Co., Ltd., China; Minyan Xue, Na Li, University of Electronic Science and Technology of China, China
Resources
No resources available.